Thickness may solve the problem, but at the cost of the effective light absorption Región of the solar spectrum, but this may reduce the efficieney of photogeneratedĬarrier collection (the minority carrier diffusion length in the a-Si is ~300 nm A thick semiconducting layer is required to trap that Silicon is a poor absorber of light at the higher wavelength (greater than 700 nm) Furthermore, a back reflector was used to minimize the transmission Material, which can serve as a top electrode contact for the a-Si thin film solarĬell as well. Work indium tin oxide (ITO, transparent and conducting) was considered as an ARC SiN x is disadvantageous due to insulating nature. Must be transparent in the visible región to reduce optical loss and must be highlyĬonductive to serve as a front contact for the thin film solar cells. Them, silicon nitride (SiN x) is the most common material used for silicon (ARC) is the most favorable solution and widely used. Therefore, the alternative technique, like quarter wavelength anti-reflection coating Well-known technique to reduce the reflection loss is surface texturing, but thisĬost to high surface recombination center of the minority carriers (Voroshilov, Simovski, Belov, & Shalin, R.i.) of air and a-Si is primarily responsible for such behavior. The front side reflection is ariseĭue the optical impedance mismatch (due to the difference of refractive Índices, In Si layer improves the optical conversión efficieney (Bishnoi & Chawla, 2017). The up-conversion of infrared región and followed by the absorption The major factor that affeets the efficieney of a thin film solar cell are the lowĪbsorption of Si in the infrared región and the reflection loss from the front side
Optical absorption depth of a-Si is only about 1 µm, ie., 2 orders of magnitude less than that of crystalline silicon, whichįavors to the fabrication of thin film solar cell. Nontoxicity, abundance, mature processing technology. Promising photovoltaic (solar) materials used for solar cell fabrication due to its In the solar industry, amorphous silicon (a-Si) is one of the Investigation has been made towards the solar energy harvesting (Bishnoi & Chawla, 2017 Saravanan & Babu, 2017), where the solarĮnergy is converted into electricity by means of electron-hole pair generation in a Harvey, “Broadband Nanostructured Antireflection Coating on Glass for Photovoltaic Applications,” 38th IEEE Photovoltaic Specialist Conference, Austin, 3-8 June 2012.Due to the requirement of alternative energy sources in near future, an intense Dhar, “Ultra-High Transmittance through Nanostructured-Coated Glass for Solar Cell Applications,” Proceedings of SPIE, Vol. Kim, “Nano- structured Multi-Layer Tailored-Refractive Index Anti- Reflection Coating for Glass with Broadband and Omni- Directional Characteristics,” Applied Physics Express, Vol. Fred Schubert, “Design of Multilayer Antireflection Coatings Made from Co-Sputtered and Low-Refractive-Index Materials by Genetic Algorithm,” Optics Express, Vol. Smart, “Optical Thin-Film Materials with Low Refractive Index for Broadband Elimination of Fresnel Reflection,” Nature Photonics, Vol. Schubert, “High-Performance Antireflection Coatings Utilizing Nanoporous Layers,” MRS Bulletin, Vol. Finke, “Development of High-Performance Radiation-Hardened Antireflection Coatings for LWIR and Multicolor IR Focal Plane Arrays,” Proceedings of SPIE, Vol. Lineberry, “EO/IR Sen- sors Development Using Zinc Oxide and Carbon Nano-structures,” Proceedings of SPIE, Vol. Becker, “Commercialization of Uncooled Infrared Technology,” Proceedings of SPIE, Vol. Wijewarnasuriya, “Multispectral EO/IR Sensor Model for Evaluating UV, Visible, SWIR, MWIR and LWIR System Performance,” Proceedings of SPIE, Vol. Wade, “Advanced InSb FPA Sensor Development at CMC Electronics,” Proceedings of SPIE, Vol. Bramhall, “Development of Low Dark Current SiGe- Detector Arrays for Visible-NIR Imaging Sensor,” Proceedings of SPIE, Vol. Lange, “InGaAs Sensor/Focal Plane Arrays for SWIR Applications,” Proceedings of SPIE, Vol. Balcerak, “Design Considerations Using APD Detectors for High Resolution UV Imaging Applications,” Proceedings of SPIE, Vol.
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